CiS
  • Research Institute
    • Profile
    • Certification
    • Network
    • Downloads
  • Competences
    • Technologies
    • Simulation & Design
    • Process Development
    • Wafer Processing
    • Assembly & Packaging
    • Measurement & Analytics
    • CAK – CiS Analytics Comptence Center
    • Prototyping & Small Batches
  • R&D
    • Microsensors for the World of Tomorrow
    • MEMS
    • MOEMS
    • Public Research
    • Funding
    • Industry Projects
  • Markets
    • Applications
    • Process measurement technology
    • Energy
    • Mobilty
    • Health
    • Climate
    • Infrared sensor technology
  • Career
    • Working in the Research Environment
    • Staff
    • Students
    • Training
    • Privacy Policy on Applications
  • News
    • News
    • Events
    • Publications & Conferences
  • CiS e.V.
    • The Association
    • Charter (PDF)
    • The Board
    • Contact CiS e.V.
    • Privacy Policy CiS e.V.
  • Contact
    • Contact Persons
    • Approach
    • Imprint
    • Privacy Policy
  • Deutsch
  • Click to open the search input field Click to open the search input field Search
  • Menu Menu

Raman spectroscopy

You are here: Home1 / Competences2 / CAK – CiS Analytics Competence Center3 / Methods4 / Raman spectroscopy

WITec Alpha 300 Access with confocal microscope
(WITec Wissenschaftliche Instrumente und Technologie GmbH)

Raman spectroscopy is the study of solids with the aid of inelastic scattering from its molecules and is used, among other things, to investigate material properties such as chemical composition, crystallinity, crystal orientation or doping. The spectroscopy method is based on the Raman effect.

In order to use Raman spectroscopy, the polarizability must change when the molecules of the sample rotate or vibrate. In Raman spectroscopy, the material under investigation is irradiated with monochromatic laser light (532 nm, 30 mW). The irradiated light interacts with the molecules of the sample under investigation and excites or deactivates vibrations or rotations, for example. Therefore, in addition to the irradiated frequency (Rayleigh scattering), other frequencies can be observed in the spectrum of the light scattered by the sample. The frequency differences to the irradiated light correspond to the energies of rotation, oscillation, phonon or spin-flip processes characteristic for the material, allowing conclusions to be drawn about the material under investigation.

  • Technologies
  • Simulation & Design
  • Process Development
  • Wafer Processing
  • Assembly & Packaging
  • Measurement & Analytics
  • CAK – CiS Analytics Competence Center
    • Methods
      • Scanning electron microscopy – SEM
      • Energy dispersive X-ray spectroscopy – EDX
      • Secondary ion mass spectrosmetry – SIMS
      • Raman spectroscopy
      • Focused Ion Beam – FIB
      • Scanning Infrared Reflection Examination – SIREX
    • Fields of application
    • Contact CAK
  • Prototyping & Small Batches
From design to prototyping.
Reliable. Long-term stable. Precise.

Konrad-Zuse-Str. 14
99099 Erfurt
Germany

Tel.: +49 361 663 1410
E-Mail: info@cismst.de

© 2025 CiS Forschungsinstitut für Mikrosensorik GmbH
  • Start
  • Deutsch
  • Imprint
  • Privacy Policy
  • Sitemap
Scroll to top Scroll to top Scroll to top