Under the motto “Change through Progress,” the MicroSystem Technology Congress 2025 kicks off today in Duisburg. More than 1,000 participants from research, industry, and politics will discuss current developments and trends in microelectronics and microsystem technology along the entire value chain. The CiS Research Institute will present an excerpt from its portfolio in three poster sessions at the 11th edition of the congress.
In the poster session “Microsensors,” Dr. Thomas Frank, head of the MEMS department at the institute, will explain research on silicon-based strain sensors, specifically on “Efficient condition monitoring with Si-DMS and RFID technology: A self-sufficient RF-based surface-mountable measurement system“ and on ”Minimizing thermal influences in Si-DMS.”
Dr. Li Long dealt with residual stresses in MEMS multilayer systems and will present his findings in the poster session “Modeling and simulation” in the poster “Modeling and extraction of residual stresses in MEMS multilayer systems.”
Julia Baldauf reports on molybdenum disilicide heating layers in her poster on “Changes in molybdenum disilicide heating layers in miniaturized infrared emitting devices caused by long-term current stressing.”
