COMPAMED, a leading international trade fair for medical suppliers, begins today in Düsseldorf. Until Thursday, 20 th November 2025, experts in the medical supply sector will gather to present components for medical devices and equipment and discuss high-tech solutions. The CiS Research Institute will be represented at the IVAM joint booth in Hall 8a, Booth F35-2.
This afternoon at the COMPAMED HIGH-TECH FORUM by IVAM (Hall 8a, G40), Dr. Martin Jahn, project manager in the MOEMS division at the institute, will give a presentation on “Silicon sensors for medical applications.” In his presentation on the developments of the CiS Research Institute in the medical field, he will introduce silicon-based MEMS sensors that can be used in both implants and endoscopy. In addition, he will explain a sensor system that records relevant vital parameters directly at the entrance to the ear canal. The High Tech Forum provides a platform for expert discussions on key technologies such as microtechnology, nanotechnology, photonics, and new materials.
This year, we will be exhibiting the following at our booth:
Highly sensitive detectors for electron radiation
Semiconductor detectors for electron radiation are used in various applications in research, medical technology, industry, and security technology. Measuring low-energy electron beams (< 1 keV) poses a particular challenge for sensors, as these beams only penetrate the detector material to a very shallow depth. The sensor must therefore be extremely surface-sensitive, which requires innovative technologies. The demonstrators developed in the project are available for sampling by users and transfer companies.
PDF: „Low Gain Avalanche Detektoren für 1keV Elektronen“ (eLGAD)
The research and development work described was funded by the German Federal Ministry for Economic Affairs and Energy (BMWE) as part of the research project “Low Gain Avalanche Detectors for 1keV Electrons” (eLGAD).
Funding code: 49MF220095
Dynamic Broadband Infrared Emitters
Infrared light carries a wealth of information – for example, the material-specific spectral absorption of infrared light can be used to determine the composition and concentration of substances and mixtures. In special cases, compact IR sensors can replace large laboratory measuring devices. This is made possible by miniaturized assemblies manufactured using silicon microsensor technology.
The CiS Research Institute focuses on the development and manufacture of innovative silicon components with a high degree of manufacturing maturity. The CiS Research Institute is an important technology partner of Micro-Hybrid Electronic GmbH for the development and manufacture of MEMS IR emitters.
PDF: „Fast infrared emitter array“ (FIRE)
The research and development work described was funded by the German Federal Ministry for Economic Affairs and Energy (BMWE) as part of the “Fast Infrared Emitter Array” (FIRE) research project.
Funding code: 49MF220020
Microsensor for tensile forces and stresses
Silicon strain gauges (Si-DMS) are highly sensitive and can also be miniaturized to an extreme degree. With chip edge lengths significantly less than one millimeter, they are capable of measuring forces and stresses in numerous applications. In addition to the sensor chip itself, the type of force-fit mounting and electrical contacting are crucial issues that are being solved at the CiS Research Institute using modern assembly and connection technology.
PDF: „Sensors for belt tension monitoring“ (ZugKraftSensor)
The research and development work described was funded by the German Federal Ministry for Economic Affairs and Energy (BMWE) as part of the research project “Sensors for belt tension monitoring” (ZugKraftSensor).
Funding code: 49MF210167
Visitors are cordially invited to visit booth F35-2 to gain insight into research and development projects with clear practical relevance. Dr. Martin Schädel, Head of MOEMS, and his team look forward to an exciting exchange with you.
