Parallel to the Sensor+Test trade fair in Nuremberg from May 6 to May 8, 2025, the 3rd Sensor and Measurement Science International (SMSI) Conference will take place at the Congress Center Nuremberg. This accompanying conference creates a unique link between science and industry and focuses on future developments in sensor technology, measurement technology, and metrology. The CiS Research Institute will be represented with nine scientific contributions.
The conference will kick off with the presentation “Fast MEMS-IR Emitters for NDIR Sensors” by Toni Schildhauer. His presentation explains the manufacture of IR emitters based on MEMS hotplate technology, which have a cut-off frequency of over 100 Hz and thus meet the requirements of innovative gas sensor technology in the wavelength range from 2 to 20 µm. Session D3 “IR and Temperature Measurement” will take place in the Zurich room. The presentation will begin at 11:20 a.m. on Wednesday, May 7, 2025.
In the afternoon, Prof. Ortlepp, Managing Director of the CiS Research Institute, will reflect on the results of research work on the topic of “Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity” in the session “B4 Optical Sensor Systems.” Highly sensitive, low-noise blue-violet avalanche photodiodes with very low noise were developed for the detection of fluorescent light. The BVAPDs developed with moderate operating voltages (around 210–220 V) are suitable for the spectral range from approx. 300 nm to 550 nm (maximum around 400 nm) and achieve an internal amplification factor well above 100. The presentation will take place in the Amsterdam room at 2:50 p.m. on Wednesday, May 7, 2025.
In the poster session on May 7, 2025, from 3:30 p.m. to 5:00 p.m., you can learn about other innovative developments from our company:
Julia Baldauf explains electromigration phenomena in molybdenum disilicide (MoSi2) in two posters, P17 and P18. Electromigration refers to the transport of material in an electrical conductor driven by electric current. The effect of the length of the test structure on the electromigration of aluminum in encapsulated MoSi2 layers will be shown, as well as changes in the layer composition of amorphous layers with an initial atomic ratio of 1Mo to 2 Si due to electrification.
Dr. Thomas Frank, Head of the MEMS Business Unit, explains in posters P23 and P24 the results of the research projects “Tension sensor for monitoring belt tension” in transmission belts and the design of a “retrofit kit for non-invasive pressure measurement in process pipes.” Both setups can be viewed at the CiS Research Institute booth 501/ in Hall 1.
Poster P22 addresses a new pneumatic measuring principle for hardness testing. It combines force and pressure sensors for precise regulation of the force increase upon impact, covers a wide load range from 1 gf to 100 kgf, and reduces lateral forces through automatic focusing.
Poster P21 presents the development of very flat 3D force sensors, including evaluation electronics and suitable software solutions for a new tactile gripping system with innovative force-feedback control for use in bomb disposal robots.
Dr. Christian Möller discusses the membrane characterization of semi-transparent photodiodes as detectors in standing wave interferometers in his poster P25. The membrane (photoactive layer) of the detectors is thinner than 1 micrometer and is optically anti-reflected by means of additional layers, thereby causing mechanical deformation. The article presents the influence of different technology variants on this deformation.
The research and development work described was funded by the Federal Ministry for Economic Affairs and Climate Action (BMWK) in research projects.
