Dr. Eng. Masayuki Fukuzawa of Kyoto Institute of Technology from Japan at CiS
Dr. Eng. Masayuki Fukuzawa of Kyoto Institute of Technology from Japan presented his research work about „Residual strain imaging in semiconductor crystals“ at CiS
MEMS design for highly stable and high-precision pressure sensors – CiS Forschungsinstitut für Mikrosensorik cooperates with TU Hamburg-Harburg
/in MEMS, PressureResearchers and developers from both institutions are working together on a project to achieve greater reliability in the development and production of application-specific piezoresistive pressure sensors with a multi-physical simulation
Healthy climate thanks to a new type of CO2 detection
/in MOEMSA new innovation action project called SMARTER-SI offers European companies a new production platform for the efficient manufacturing of innovative and intelligent sensor components and microsystems in small and medium quantities
CiS as exhibitor at the Zuse Days
/in EventsThe institutes of the Zuse Association presented themselves to the public together for the first time in Berlin on 7 and 8 June 2016. Under the patronage of the Federal Minister of Economics and Technology, Sigmar Gabriel, and with the motto “Research that gets there”, 60 institutes of the Zuse Association provided an insight into their research activities
Microcondensation sensors for the Japanese market – CiS signs distribution agreement with ESPEC Corp.
/in MEMSCiS Forschungsinstitut für Mikrosensorik GmbH announces the signing of a distribution agreement with ESPEC Corp. on microcondensation sensors for the Japanese market. With this agreement, CiS grants the exclusive right to market and sell customised microcondensation sensors in Japan
With thin pixel radiation detectors close to the collision point
/in Silicon Detectors, WaferprocessingThe CiS Research Institute has developed large-area radiation detectors whose sensitive area is thinned down to the thickness of a normal sheet of paper. During processing, it was possible to dispense with the use of additional handling wafers, which is still common practice in industrial production today
Multichannel sensors for the nanolitre rang
/in Analytics, Medical technology, MOEMSA multi-channel measuring head for investigations on sample volumes in the nanolitre range is currently being developed at the CiS Research Institute together with international partners within the framework of the European research project “SMARTER-SI” (GA-Nr. 644596). The principle is based on fluorescence and absorption measurement on an array of different enzyme pixels
European network SMARTER-SI supports companies in manufacturing smart systems
/in Measurement, Medical technology, MEMS, MOEMS, PressureThe SMARTER-SI project offers a novel manufacturing platform across Europe on which innovative and intelligent sensor components and microsystems can be produced cost-effectively in small and medium quantities. Around 5.3 million euros in funding will flow into the development and testing of this platform until 2018
Dew sensor with calibrated digital output signal
/in MEMSCiS has expanded its CCC® platform and for the first time offers microcondensation sensors with a calibrated digital output signal.
The aim is to effectively support customer-specific developments (condensate mass, temperature, design, assembly and connection technology)
Highly stable temperature diodes with single-point calibration for the temperature range up to 220°C
/in Silicon Detectors, WaferprocessingAt the CiS Research Institute, technological processes for silicon wafers were developed with which a reproducible sensitivity dU/dT, i.e. the slope of the voltage versus temperature, could be achieved